SANTA CLARA, Calif. — Advantest Corp. today announced it has begun selling new DRAM and flash memory tester that has the ability to simultaneously test up to 128 devices at a time with speeds of 143 ...
FREMONT, Calif. — In a move to lower the cost of test, Credence Systems Corp. here today announced a new desktop tester for low-voltage, flash-memory devices. The Personal Kalos XZ from Credence is a ...
T5773 and HA5100CELL are new solutions that accommodate high-capacity, high-speed, next-generation NAND flash memory devices from wafer test to volume production. The T5773 Test System provides ...
TOKYO--(BUSINESS WIRE)--Advantest Corporation (TSE: 6857, NYSE: ATE) today announced the availability of two new solutions for next-generation NAND flash memory test: the T5773 for package test and ...
TOKYO—Semiconductor test equipment supplier Advantest Corporation has announced its next-generation B6700D memory burn-in tester to meet growing global customer demand for server and mobile ...
Teradyne Inc., a maker of electronic test equipment based in North Reading, reports it has agreed to spend $325 million to purchase San Jose-based Nextest Systems Corp. The acquisition would provide ...
Octal flash memory, or octal data transfer interface, utilizes eight data lines for input and output operations, resulting in significantly higher data transfer rates compared to serial, dual, and ...
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