Enlightened, multidisciplinary engineers may be dismantling the oft-decried wall between design and test, but some of the bricks that made up that wall may have been reassembled into a wall between ...
This article is a condensed version of an article that appeared in the November/December 2022 issue of Chip Scale Review. Adapted with permission. Read the original ...
SE: Why is applying functional test content so challenging today? Ruiz: There are a couple of different factors that make successfully applying functional patterns on the tester a challenge. In fact, ...
Decades of advances in the semiconductor industry continue to drive an insatiable consumer demand for smaller, more powerful, more ubiquitous semiconductor devices—whether in our cars, within our ...
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