Testability strategies able to handle 65-nm and denser processes highlighted EDA firms’ presentations at last week’s International Test Conference. In particular, power-aware and small-delay-defect ...

Success in the electronics business hinges on producing high-quality products and using the most cost-effective methods to do so. As the number of devices on integrated circuits continues to double ...

Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.