AZoOptics

Fast 3D Defect and Surface Roughness Measurement for Manufacturing Quality Control

Optical 3D metrology enables fast, non-contact surface roughness measurement of defects and roughness for precise ...
EDN

Electroglas Intros Automated Defect Classification

Process management tools company Electroglas Inc. today introduced DefectID, its automatic defect classification software. Aimed at improving manufacturing productivity and yields for wafer ...
Semiconductor Engineering

Using Automatic Defect Classification To Reduce The Escape Rate Of Defects

Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control.
EDN

KLA-Tencor™ Announces New Surfscan® SP3 Defect and Surface Quality Inspection Systems for Substrate Manufacturing and IC Process Monitoring

“Launching a new Surfscan platform is an exciting event for KLA-Tencor,” said Ali Salehpour, senior vice president and general manager of the Surfscan / ADE division at KLA-Tencor. “The visible-light ...
Nanowerk

Defect States: Imperfections That Shape Nanomaterial Properties

Defect states refer to electronic energy levels that arise from imperfections or irregularities in the crystal structure of materials, particularly in semiconductors and insulators. These ...