Time-dependent dielectric breakdown (TDDB) testing is an indispensable step in qualifying semiconductor gate-oxide integrity, and vendors are responding with the instrumentation and probing ...
Suppliers of gallium nitride (GaN) and silicon carbide (SiC) power devices are rolling out the next wave of products with some new and impressive specs. But before these devices are incorporated in ...
PORTLAND, Ore. — Low-k dielectric materials are super-insulators that help designers scale down chip size, but at the expense of shortening the average lifetimes of their chips. The problem is ...
STAr Technologies, a provider of semiconductor test solutions, releases a new Sagittarius-WLR integrated platform for advanced Wafer-Level Reliability (WLR) tests. Sagittarius-WLR is developed to ...
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