A Test, Debug, and Silicon Lifecycle Management Architecture for a UCIe-Based Open Chiplet Ecosystem
Abstract: In the last few years, chiplets have become foundational to continuing the pace of innovation. The chiplet market is projected to significantly ramp up in the next few years, and we need to ...
Abstract: Several circuit components can induce bit errors at high-speed wireline interfaces. Hence, accurate identification and correction of error points in various ...
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